• Journal Article

Deposition and characterization of undoped and boron and phosphorus doped (SixGe1-xO2) glass films

Citation

Simpson, D. L., Croswell, R. T., Reisman, A., Williams, C. K., & Temple, D. (2000). Deposition and characterization of undoped and boron and phosphorus doped (SixGe1-xO2) glass films. Journal of the Electrochemical Society, 147(4), 1560-1567.

Abstract