• Article

Deposition and characterization of undoped and boron and phosphorus doped (SixGe1-xO2) glass films

Citation

Simpson, DL., Croswell, RT., Reisman, A., Williams, CK., & Temple, D. (2000). Deposition and characterization of undoped and boron and phosphorus doped (SixGe1-xO2) glass films. Journal of the Electrochemical Society, 147(4), 1560-1567.