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Optical constants of Bi2Te3 and Sb2Te3 measured using spectroscopic ellipsometry

Cui, H., Bhat, IB., & Venkatasubramanian, R. (1999). Optical constants of Bi2Te3 and Sb2Te3 measured using spectroscopic ellipsometry. Journal of Electronic Materials, 28(10), 1111-1114.

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