In-situ monitoring of the growth of Bi2Te3 and Sb2Te3 films and Bi2Te3-Sb2Te3 superlattice using spectroscopic ellipsometry

Cui, R., Bhat, I., O'Quinn, B., & Venkatasubramanian, R. (2001). In-situ monitoring of the growth of Bi2Te3 and Sb2Te3 films and Bi2Te3-Sb2Te3 superlattice using spectroscopic ellipsometry. Journal of Electronic Materials, 30(11), 1376-1381.

Publications Info

To contact an RTI author, request a report, or for additional information about publications by our experts, send us your request.

Recent Publications

Article

The daily association between affect and alcohol use: A meta-analysis of individual participant data
Article

The use of patient experience feedback in rehabilitation quality improvement and codesign activities
Article

Protection of forest ecosystems in the eastern United States from elevated atmospheric deposition of sulfur and nitrogen
Article

SPTSSA variants alter sphingolipid synthesis and cause a complex hereditary spastic paraplegia