In-situ monitoring of the growth of Bi2Te3 and Sb2Te3 films and Bi2Te3-Sb2Te3 superlattice using spectroscopic ellipsometry
Citation
Cui, R., Bhat, I., O'Quinn, B., & Venkatasubramanian, R. (2001). In-situ monitoring of the growth of Bi2Te3 and Sb2Te3 films and Bi2Te3-Sb2Te3 superlattice using spectroscopic ellipsometry. Journal of Electronic Materials, 30(11), 1376-1381.