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In-situ monitoring of the growth of Bi2Te3 and Sb2Te3 films and Bi2Te3-Sb2Te3 superlattice using spectroscopic ellipsometry

Cui, R., Bhat, I., O'Quinn, B., & Venkatasubramanian, R. (2001). In-situ monitoring of the growth of Bi2Te3 and Sb2Te3 films and Bi2Te3-Sb2Te3 superlattice using spectroscopic ellipsometry. Journal of Electronic Materials, 30(11), 1376-1381.

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