Article
In-situ monitoring of the growth of Bi2Te3 and Sb2Te3 films and Bi2Te3-Sb2Te3 superlattice using spectroscopic ellipsometry
Cui, R., Bhat, I., O'Quinn, B., & Venkatasubramanian, R. (2001). In-situ monitoring of the growth of Bi2Te3 and Sb2Te3 films and Bi2Te3-Sb2Te3 superlattice using spectroscopic ellipsometry. Journal of Electronic Materials, 30(11), 1376-1381.
Publications Info
To contact an RTI author, request a report, or for additional information about publications by our experts, send us your request.
Recent Publications
Article
The use of patient experience feedback in rehabilitation quality improvement and codesign activities
Article
Protection of forest ecosystems in the eastern United States from elevated atmospheric deposition of sulfur and nitrogen
Article