Optical investigation of strain and defects in (100) CdTe/Ge/Si and ZnTe/Ge/Si grown by molecular beam epitaxy
Hutchins, JW., Skromme, BJ., Chen, YP., Sivananthan, S., & Posthill, J. (1997). Optical investigation of strain and defects in (100) CdTe/Ge/Si and ZnTe/Ge/Si grown by molecular beam epitaxy. Applied Physics Letters, 71(3), 350-352.
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