• Journal Article

Optical investigation of strain and defects in (100) CdTe/Ge/Si and ZnTe/Ge/Si grown by molecular beam epitaxy

Citation

Hutchins, J. W., Skromme, B. J., Chen, Y. P., Sivananthan, S., & Posthill, J. (1997). Optical investigation of strain and defects in (100) CdTe/Ge/Si and ZnTe/Ge/Si grown by molecular beam epitaxy. Applied Physics Letters, 71(3), 350-352.

Abstract