• Journal Article

Investigation of thickness effects on AlN coated metal tips by in situ I-V measurement

Citation

Kang, D. H., Zhirnov, V. V., Wojak, G. J., Preble, E. A., Choi, W. B., Hren, J. J., & Cuomo, J. J. (1999). Investigation of thickness effects on AlN coated metal tips by in situ I-V measurement. Journal of Vacuum Science & Technology B, 17(2), 632-634.

Abstract

The effects of the aluminum nitride coating thickness on molybdenum emitter tips were investigated by an in situ I-V measurement technique inside a typical magnetron sputtering system. ALN was deposited on Mo tips using a de-modulated 1 kW power source at 200 degrees C. Each I/V measurement was carried out immediately following a 15 a ALN deposition. Significantly improved field emission was observed as well as a strong emission thickness dependence, which we attribute to the influence of space charge. (C) 1999 American Vacuum Society. [S0734-211X(99)04002-0].