Low Interface Trap Density for Remote Plasma Deposited SiO2 on n-type GaN

Kenneth H. Davis; R. E. Folsom; F. Ivy Carroll; Phillip C. Cooley; Lyle M. Retzlaff; Michael F. Weeks; H. Koo; Herbert H. Seltzman; E. Pellizzari; Deborah W. McFadden; Roger D. Austin; Martin B. Lee; Judith T. Lynch; Debra M. Fleischmann; Carol Place; Stephen D. Cooper; Rick L. Williams; Lillie B. Barber; Doris J. Rouse; Ivey A. McDaniel; Charlotte O. Scheper; Paul Kizakevich; Donna M. Jewell; Marion E. Deerhake; Cora B. Parker; Eugene P. Brantly; Phyllis D. Elkins; Patricia A. Cunningham; Robert S. Truesdale; Sara C. Wheeless; Robert M. Bray; Cynthia A. Salmons; Gary B. Howe; Coleen M. Northeim; Susan K. Myers; Gordon M. Cressman; Josephine A. Mauskopf; Tim J. Gabel; Luis Arturo Crouch; Celia D. Keller; Lisa E. Packer; Pamela B. Lamb; Keith White Little; Nathaniel F. Rodman; M. Owen; James P. Hayes; Daniel L. Winfield; Deborah A. Gibbs; Janice E. Kelly-Reid; Wayne G. Winstead; Cindy O. McClintock; Terrence K. Pierson; Johnny R. Albritton; Sherry L. Black; Jeffrey B. Coburn; Joe B. Simpson; Ed E. Rickman; James T. Hanley; R. Suresh; Barbara L. Kroner; K. Heller; James C. Blake; Barri B. Burrus; Anthony C. Clayton; Donna S. Womack; S. Mascarella; Scott A. Guthrie; Sheryl C. Cates; Albert D. Bethke; Suson F. VonLehmden; Kathryn L. Dowd; Daniel J. Pratt; Lisa J. McQuay; Matthew A. Koch; Jonathan T. Ennis; Robert A. Zerbonia; Nick L. Kinsey; Susan H. Kinsey; Christopher P. Carson; J. Newsome; S. Keesling; James A. O'Rourke; Kathryn R. Batts; Craig R. Hollingsworth; Priya Suresh; Joseph Wendell Wilson; Vorapranee Wickelgren; E. Andrew Jessup; Diana S. Goss; Sheri E. Fehnel; Gayle S. Bieler; Donna P. Coleman; R. Crawford; Jeanne Ann Snodgrass; Nellie I. Hansen; Michelle Lang; Deirdre M. Mladsi; Gary A. Zarkin; Rachel A. Caspar; Carol L. Woodell; HC Casey Jr; G Fountain; Randall Alley; BP Keller; SP DenBaars

Low Interface Trap Density for Remote Plasma Deposited SiO2 on n-type GaN

Casey Jr, HC., Fountain, G., Alley, R., Keller, BP., & DenBaars, SP. (1996). Low Interface Trap Density for Remote Plasma Deposited SiO2 on n-type GaN. Applied Physics Letters, 68, 1850.

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Low Interface Trap Density for Remote Plasma Deposited SiO2 on n-type GaN

Meet the Experts

Barbara L. Kroner

Barri Burrus

Cynthia Salmons

Dan Pratt

Donna Womack

Gary A. Zarkin

Gayle Bieler

J. Todd Ennis

Recent Publications

Treatment preferences among patients with mild-to-moderate atopic dermatitis

Understanding how infection prevention influences nurses' task sequencing using a mixed-methods, simulation-based approach

Consensus-based framework for evaluating data modernization initiatives

∆8-THC-COOH cross-reactivity with cannabinoid immunoassay kits and interference in chromatographic testing methods