Davis, J. L., Mills, K., Lamvik, MI., Yaga, R., Shepherd, S. D., Bittle, J., Baldasaro, N., Solano, E., Bobashev, G., Johnson, C., & Evans, A. (2014). System reliability for LED-based products. In 15th International Conference on Thermal, Mechanical and Multi-physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 7-9 April 2014, Ghent, Belgium (pp. 1-7) https://doi.org/10.1109/EuroSimE.2014.6813879
Results from accelerated life tests (ALT) on mass-produced commercially available 6" downlights are reported along with results from commercial LEDs. The luminaires capture many of the design features found in modern luminaires. In general, a systems perspective is required to understand the reliability of these devices since LED failure is rare. In contrast, components such as drivers, lenses, and reflector are more likely to impact luminaire reliability than LEDs.
