• Journal Article

Transmission electron microscopy study of the structure of radio frequency sputter-deposited yttria-stabilized zirconia thin films

Citation

Ruddell, D., Stoner, B., & Thompson, J. (2003). Transmission electron microscopy study of the structure of radio frequency sputter-deposited yttria-stabilized zirconia thin films. Journal of Materials Research, 18(1), 195-200.

Abstract