Computer Tech Workshop: New Features for Clustered and Survey Data Analysis in SUDAAN Release 9.0.3
Pitts, A. D. (2007, August). Computer Tech Workshop: New Features for Clustered and Survey Data Analysis in SUDAAN Release 9.0.3. Presented at ASA JSM 2007, Salt Lake City, UT.
This workshop will highlight ten new features in SUDAAN Release 9.0.3 that are available to researchers analyzing cluster-correlated or complex survey data. In summary, these features include: 1) CMH Test of Trends; 2) addition of new tests statistics including the Rao-Scott test; 3) small proportion confidence interval estimation; 4) introduction of a weighted Kappa; 5) Chi-Squared test to known proportions; 6) updated memory manager; 7) revised PRINT capabilities; 8) Logrank test in KAPMEIER; 9) percentile correction in PROC DESCRIPT; and 10) INCLUDE option in every procedure. The workshop will include a brief review of statistical problems encountered in survey data plus a brief introduction to SUDAAN syntax. The attendees are not required to be SUDAAN users, but should have a good knowledge of statistical issues present in correlated data and surveys and be familiar with commonly used statistical methods and categorical data analysis. The new SUDAAN features will be demonstrated on complex survey data. We will demonstrate proper implementation of SUDAAN, provide interpretation of the output, and discussion of statistical issues related to the data. The data sets, the SUDAAN code used in the presentation, and a 30-day trial version of SUDAAN Release 9.0.3 will be provided to the attendees.