• Journal Article

Comparative study of Ni nanowires patterned by electron-beam lithography and fabricated by lift-off and dry etching techniques

Citation

Park, Y. D., Jung, K. B., Overberg, M., Temple, D., Pearton, S. J., & Holloway, P. H. (2000). Comparative study of Ni nanowires patterned by electron-beam lithography and fabricated by lift-off and dry etching techniques. Journal of Vacuum Science & Technology B, 18(1), 16-20.

Abstract