Microanalysis and Microscopy
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We provide a variety of technical support in the areas of microanalysis and microscopy to state and federal agencies and commercial clients. Our state-of-the-art facilities and equipment allow us to size structures and particles, determine particle chemistry and composition, observe morphological characteristics, and determine the mineralogical source of the material. Our specialty is in helping clients determine the source of problems associated with contamination, process control, product failure/corrosion, and product research and development.
Capabilities
- Fourier Transform Infrared Spectroscopy
- Scanning Electron Microscopy – High Resolution
- Scanning Electron Microscopy – Environmental Chamber
- X-Ray Diffraction Analysis
- Atomic Force Microscopy
- Transmission Electron Microscopy
- Optical Microscopy
- X-Ray Fluorescence / X-Ray Photoelectron Spectroscopy
- Gravimetry
- Photoluminescence Spectroscopy
- Spectral Ellipsometry
- Sample Preparation Facilities
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