Microanalysis and Microscopy: Applications

Surface Measurement and Force Measurement

We possess both microscopic and spectroscopic characterization capabilities for materials surface analysis. Using microscopic techniques such as SEM-EDX, AFM, and optical microscopy plus spectroscopic techniques such as XPS and FT-infrared reflective spectroscopy, we can obtain high-resolution images and information on surface roughness and porosity, surface metal composition, and organic coating species and contaminations.

Recently, our scientists assisted a company that produces lithoplates by helping them determine the cause of tiny imperfections in their plates that had rendered them unusable for printing. We can also support exposure science and drug delivery research using force measurement capabilities to study particle-substrate interaction at nano-Newton levels.

Contact: Li Han