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Materials Science: Capabilities


Materials Characterization

RTI characterizes materials to answer client questions about defects, failure analysis, thin-film composition and microstructure, semiconductor characterization, surface topography, and other materials properties. We have a proven track record in adhesives, chemicals, flat panel displays, IC packaging, lighting, micro-electromechanical systems (MEMS), nanotechnology, metals, optical disk drives, polymers, semiconductors, and steel. Our analytical techniques can provide the following information:

  • Surface elemental analysis
  • Surface chemical bonding
  • Depth profiling
  • Bulk elemental analysis
  • Film thickness and optical constants
  • Surface morphology and roughness
  • Microscopy and imaging
  • Radiographic analysis

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