Microanalysis and Microscopy: Capabilities
Scanning Electron Microscopy – High Resolution
SEM is used for viewing, imaging, and analyzing the surface structure of a wide variety of samples, ranging from airborne pollutants to electronic circuits and manufactured parts. It is one of the most useful microscopes, as it can image large and small structures and can be applied to almost any kind of sample with minimal preparation. It produces beautiful images of sample surfaces at a wide range of magnifications. Structures and particles can be measured digitally. Both digital and photographic images can be produced. Using an attached energy-dispersive X-ray spectrometer, the SEM can identify the elements the sample is composed of and can perform elemental mapping (distribution of the various elements in a sample). Elements as light as boron and as heavy as uranium can be quickly identified. Sample size can range from micrometer-sized particles mounted on a smooth substrate to samples several centimeters in size. The high-resolution SEM is capable of magnifying an image in excess of 50,000 times and can resolve particles and structures smaller than 10 nanometers.
Contact: Owen Crankshaw