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Microanalysis and Microscopy: Capabilities

Atomic Force Microscopy

The AFM is used to characterize the surface morphology of solid samples. The unique aspect of the AFM is its ability to provide information at atomic dimensions. Sample surfaces (topography must be very flat) are scanned by an extremely fine tip, which when dragged over the surface transmits to the computer an indication of each microtopographical feature, building a virtual image of the sample surface. With a resolution of 1-2 nanometers, AFM is ideal for applications such as surface roughness in the semiconductor industry and for looking at very small particles and structures, especially at the nanometer level. It can also be used for the examination of soft structures such as biological materials or polymers.

Contact: Li Han